JSM-IT810 – Schottky Field Emission Scanning Electron Microscope

Versatility and high spatial resolution meet automation with the JSM-IT810 series FE-SEM.No-coding automation for imaging and EDS analysis is built-in for a streamlined and efficient workflow. New functions are available to ensure high quality data and an enhanced user experience for all SEM users. Functions include the SEM automatic adjustment package, a trapezoidal correction function […]