Wafer Surface Measurement System – WSM1200
Precision systems for wafer surface measurement in semiconductor processes. Categories: Automated Wafer Measurement System, Semiconductor, Semiconductor Advanced Metrology System (AMS Series), Wafer Surface Measurement WSM1200 is designed for measuring the areal and surface of 6” and 8” wafer surface. System comes with one load port, 3-axis Hirata single arm ATM robot, wafer pre-aligner module and […]
Wafer Roughness Measuring System – MPS2100
The MP2100 is Chapman Instruments’ latest high-resolution proler. Specially designed for surface measurements and analysis, it can be used as both a production tool for inline quality inspection, as well as a research and development tool for establishing standards and researching tolerances
Wafer Thickness & Roughness Measuring System – MPT1000
Categories: Automated Wafer Measurement System, Semiconductor, Semiconductor Advanced Metrology System (AMS Series), Wafer Roughness Measuring, Wafer Thickness & Roughness Measuring The MPT1000 is Chapman Instruments’ latest non-contact system, providing wafer thickness measurements. It can be used as a production tool for in-line quality inspection, a research and development tool for establishing standards, and compiling data […]
ICP-OES Spectrometer – SPECTRO ARCOS
The Versatility and Precision of ICP-OES Spectrometers
In the field of elemental analysis, ICP-OES Spectrometers stand out for their precision and versatility.
Stereo Microscopes – SMZ445 & SMZ460
The SMZ445 and SMZ460 deliver the outstanding optical performance you expect from Nikon’s cutting-edge series of stereoscopic zoom microscopes. Porro prisms enable a lightweight, compact design. Choose between the two models: the SMZ445 with 0.8x – 3.5x zoom magnification or the SMZ460 with 0.7x – 3.0x zoom magnification, inclination angles of 45° or 60° respectively. […]
Handheld XRF Analyzer – SPECTRO xSORT XHH03
The SPECTRO xSORT XHH03 handheld XRF spectrometer offers unparalleled convenience, precision, and versatility for on-site material analysis. Its ergonomic design, rapid screening capabilities, and ability to handle a wide range of materials make it an essential device for professionals across various industries. Whether you’re conducting routine RoHS testing, environmental screening, or analyzing complex materials, the […]
T300
The PUDU T300 is an industrial-grade delivery robot with a 300 kg payload capacity, designed to efficiently transport heavy loads in industrial and commercial environments. Built on a robust mobile chassis, it ensures stability, reliability, and smooth operation. The robot features a built-in touchscreen and ergonomic handle, allowing standalone operation without the need for a […]
3D Optical Profiler – S Neox
The new S Neox optical profilometer outperforms existing optical 3D profiling microscopes in terms of performance, functionality, efficiency and design, providing Sensofar with a class-leading areal measurement system. Faster than ever – Everything is faster than before with new smart and unique algorithms and a new camera. Data acquisition is taken at 180 fps. Standard […]